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Standards of Piezoelectric and Dielectric Components

Piezoelectric and Dielectric Componentsn all the procedures specified in the standard by applying all the necessary methods to perform the certification process by testing.

 

TS EN 168101 Blank detail specification: Quartz crystal units (qualification acceptance)

TS EN 168201 Blank detail specification: Quartz crystal units (quality approval)

TS EN 169201 Blank detail specification: Quartz crystal controlled oscillators (quality approval)

TS EN 60444-1 Measurement of quartz crystal unit parameters in a network by zero phase technique - Part 1

TS EN 60368-2-2 Piezoelectric sieves - Part 2: Operating instructions for piezoelectric sieves - Part 2: Piezoelectric ceramic sieves (IEC60368-2-2: 1999)

TS EN 170100 Part feature standard - Waveguide type dielectric resonators

TS EN 170101 Cavity - Dielectric resonators with waveguides - Capability approval

TS EN 60368-4-1 Piezoelectric filters with quality assessment - Part 4-1: Blank detail specification - Capability approval

TS EN 60679-5 Quartz crystal controlled oscillators -Quality control made-Part 5: Part feature-Quality approval

TS EN 60679-5-1 Quartz crystal controlled oscillators -Quality control made-Part 5: Blank detail feature -Quality approval

TS EN 60368-4 Quality assessed piezoelectric filters section 4: Section feature - Capability approval

TS EN 60368-4-1 Piezoelectric filters with quality assessment - Part 4-1: Blank detail specification - Capability approval

TS EN 60444-7 Measurement of quartz crystal unit parameters - Part 7: Measurement of quartz crystal units operation and frequency reductions

TS EN 60444-8 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

TS EN 60122-1 Quality-assessed quartz crystal units - part 1: General specification standard

TS EN 60444-1 / A1 Measurement of quartz crystal unit parameters in a network with zero phase technique - Part 1

TS EN 168201 Quartz crystal units (quality approval) - Blank detail specification

TS EN 60444-1 / A1 Measurement of quartz crystal unit parameters in a pi circuit with zero phase technique section 1: Basic method for measuring the resonance resistance and resonance frequency of quartz crystal units in a pi circuit with zero phase technique

TS EN 60444-9 Measurement of quartz crystal unit parameters - Part 9: Measurement of false resonances of piezoelectric crystal units

TS EN 60684-2 Flexible insulating sleeve - Part 2: Test methods

TS EN 62604-2 Surface acoustic wave (SAW) and stacked acoustic wave (BAW) pairs

TS EN 60122-3 Quality-rated quartz crystal units - part 3: Standard main dimensions and leg connections

TS EN 60368-3 Piezoelectric filters with quality assessment - Part 3: Standard main dimensions and leg connections

TS EN 61837-1 Surface-coated electric devices for frequency control and selection - Standard drafts and front-end connections - Part 1: Plastic cast coating dies

TS EN 62575-2 Radio frequency (RF) acoustic wave filters (BAW) quality assessment - Part 2: User manual

TS EN 60679-3 Liquid crystal controlled oscillators - Quality assured - Part 3: Standard outlines and leg connections

TS EN 60444-6 Measurement of quartz crystal unit parameters-Section 6: Measurement of drive level dependency (ssb)

TS EN 61837-2 / A1 Surface mounted piezoelectric elements for frequency control and selection - Standard outlines and terminal end connections - Part 2: Ceramic housings

TS EN 62761 Basic principles for measuring non-linearity in radio frequency (RF) surface acoustic wave (SAW) and volumetric acoustic wave (BAW) elements

TS EN 62575-1 Quality assessed radio frequency (RF) collective acoustic wave (BAW) filters - Part 1: General standard

TS EN 62604-1 Quality assessed surface acoustic wave (SAW) and collective acoustic wave (BAW) duplex - Part 1: General standard

TS EN 60862-1 Qualified surface acoustic wave filters: Part 1: General specification standard

TS EN 61837-3 Surface-mounted pizoelectronic devices for frequency control and selection - Standard frames and end copper connections - Part 3: Metal coaters

TS EN 60758 Synthetic quartz crystal - Specifications and instructions for use

TS EN 62276 Single crystal plates for surface acoustic wave applications - Specification and measurement methods

TS EN 61240 Piezoelectric elements - Preparation of outline drawings of surface mounted elements (SMD) for frequency control and selection - General rules

TS EN 50324-1 Piezoelectric properties of ceramic materials and components-Part 1: Terms and definitions

TS EN 50324-2 Piezoelectric properties of ceramic materials and components-Part 2: Measurement methods low power

TS EN 50324-3 Piezoelectric properties of ceramic materials and components-Part 3: Measurement methods-High power

TS EN 61967-5 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 5: Measurement of contact transmissions - Bench faraday cage method

TS EN 61967-6 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method

TS EN 61967-4 / A1 Integrated circuits-150 kHz to 1 ghz measurement of electromagnetic emission-Part 4: Measurement of transmitted emission-1 / 150 direct coupling method

TS EN 61967-6 / A1 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method

TS EN 62090 Product package labels for electronic components using barcodes and two-dimensional symbols

TS EN 62132-5 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 5: Faraday cage method for the test table

TS EN 62132-3 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 3: Mass current injection method

TS EN 62132-4 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 4: Direct method of intervening rf power

TS EN 62132-2: 2011 Integrated circuits - Electromagnetic immunity measurements - Part 2: Irradiated immunity measurements- Tem cell and broadband tem cell method

TS EN 62258-5 Semiconductor molding products - Part 5: Rules for information on electrical simulation

TS EN 62258-6 Semiconductor molding products - Part 6: Guidelines for information on thermal simulation

TS EN 62417 Semiconductor devices - Mobile ion experiments for metal oxide semiconductor field effect transistors (mosfet)

TS EN 62433-2 Emu ic modeling - Part 2: Integrated circuit models for emi behavior simulation - Modeling of transmissions through transmission (icce-Ce)

TS EN 165000-1 Film and hybrid integrated circuits - Part 1: General features - capability approval process

TS EN 165000-2 Film and hybrid integrated circuits - part 2: Internal visual inspection and special tests

TS EN 165000-3 Film and hybrid integrated circuits - Part 3: Self-check checklist and report for film and hybrid integrated circuit manufacturers

TS EN 165000-4 Film and hybrid integrated circuits - Part 4: Customer information, product evaluation level plans and blank detail specification

TS EN 165000-5 Film and hybrid integrated circuits - Part 5: Quality approval process

TS EN 190000 General features: Monolithic integrated circuits

TS EN 190100 Part features: Digital monolithic integrated circuits

TS EN 190101 Family features: Digital integrated ttl circuits, 54, 64, 74, 84 series

TS EN 190102 Family features: Ttl schottky digital integrated circuits, 54s, 64s, 74s, 84s series

TS EN 190103 Family features: Digital integrated ttl low power schottky circuits, 54ls, 64ls, 74ls, 84ls series

TS EN 190106 Family features: Ttl advanced low-power schottky digital integrated circuits, 54als and 74als series

TS EN 190107 Family features: Ttl fast digital integrated circuits, 54f and 74f series

TS EN 190108 Family features: Ttl advanced schottky digital integrated circuits, 54as and 74as series

TS EN 190109 Family features: Digital integrated hc mos circuits, hc / hct / hcu series

TS EN 190110 Empty detail specification: Digital microprocessor integrated circuits

TS EN 190116 Family features: Ac mos digital integrated circuits