Piezoelectric and Dielectric Componentsn all the procedures specified in the standard by applying all the necessary methods to perform the certification process by testing.
TS EN 168101 Blank detail specification: Quartz crystal units (qualification acceptance)
TS EN 168201 Blank detail specification: Quartz crystal units (quality approval)
TS EN 169201 Blank detail specification: Quartz crystal controlled oscillators (quality approval)
TS EN 60444-1 Measurement of quartz crystal unit parameters in a network by zero phase technique - Part 1
TS EN 60368-2-2 Piezoelectric sieves - Part 2: Operating instructions for piezoelectric sieves - Part 2: Piezoelectric ceramic sieves (IEC60368-2-2: 1999)
TS EN 170100 Part feature standard - Waveguide type dielectric resonators
TS EN 170101 Cavity - Dielectric resonators with waveguides - Capability approval
TS EN 60368-4-1 Piezoelectric filters with quality assessment - Part 4-1: Blank detail specification - Capability approval
TS EN 60679-5 Quartz crystal controlled oscillators -Quality control made-Part 5: Part feature-Quality approval
TS EN 60679-5-1 Quartz crystal controlled oscillators -Quality control made-Part 5: Blank detail feature -Quality approval
TS EN 60368-4 Quality assessed piezoelectric filters section 4: Section feature - Capability approval
TS EN 60368-4-1 Piezoelectric filters with quality assessment - Part 4-1: Blank detail specification - Capability approval
TS EN 60444-7 Measurement of quartz crystal unit parameters - Part 7: Measurement of quartz crystal units operation and frequency reductions
TS EN 60444-8 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
TS EN 60122-1 Quality-assessed quartz crystal units - part 1: General specification standard
TS EN 60444-1 / A1 Measurement of quartz crystal unit parameters in a network with zero phase technique - Part 1
TS EN 168201 Quartz crystal units (quality approval) - Blank detail specification
TS EN 60444-1 / A1 Measurement of quartz crystal unit parameters in a pi circuit with zero phase technique section 1: Basic method for measuring the resonance resistance and resonance frequency of quartz crystal units in a pi circuit with zero phase technique
TS EN 60444-9 Measurement of quartz crystal unit parameters - Part 9: Measurement of false resonances of piezoelectric crystal units
TS EN 60684-2 Flexible insulating sleeve - Part 2: Test methods
TS EN 62604-2 Surface acoustic wave (SAW) and stacked acoustic wave (BAW) pairs
TS EN 60122-3 Quality-rated quartz crystal units - part 3: Standard main dimensions and leg connections
TS EN 60368-3 Piezoelectric filters with quality assessment - Part 3: Standard main dimensions and leg connections
TS EN 61837-1 Surface-coated electric devices for frequency control and selection - Standard drafts and front-end connections - Part 1: Plastic cast coating dies
TS EN 62575-2 Radio frequency (RF) acoustic wave filters (BAW) quality assessment - Part 2: User manual
TS EN 60679-3 Liquid crystal controlled oscillators - Quality assured - Part 3: Standard outlines and leg connections
TS EN 60444-6 Measurement of quartz crystal unit parameters-Section 6: Measurement of drive level dependency (ssb)
TS EN 61837-2 / A1 Surface mounted piezoelectric elements for frequency control and selection - Standard outlines and terminal end connections - Part 2: Ceramic housings
TS EN 62761 Basic principles for measuring non-linearity in radio frequency (RF) surface acoustic wave (SAW) and volumetric acoustic wave (BAW) elements
TS EN 62575-1 Quality assessed radio frequency (RF) collective acoustic wave (BAW) filters - Part 1: General standard
TS EN 62604-1 Quality assessed surface acoustic wave (SAW) and collective acoustic wave (BAW) duplex - Part 1: General standard
TS EN 60862-1 Qualified surface acoustic wave filters: Part 1: General specification standard
TS EN 61837-3 Surface-mounted pizoelectronic devices for frequency control and selection - Standard frames and end copper connections - Part 3: Metal coaters
TS EN 60758 Synthetic quartz crystal - Specifications and instructions for use
TS EN 62276 Single crystal plates for surface acoustic wave applications - Specification and measurement methods
TS EN 61240 Piezoelectric elements - Preparation of outline drawings of surface mounted elements (SMD) for frequency control and selection - General rules
TS EN 50324-1 Piezoelectric properties of ceramic materials and components-Part 1: Terms and definitions
TS EN 50324-2 Piezoelectric properties of ceramic materials and components-Part 2: Measurement methods low power
TS EN 50324-3 Piezoelectric properties of ceramic materials and components-Part 3: Measurement methods-High power
TS EN 61967-5 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 5: Measurement of contact transmissions - Bench faraday cage method
TS EN 61967-6 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method
TS EN 61967-4 / A1 Integrated circuits-150 kHz to 1 ghz measurement of electromagnetic emission-Part 4: Measurement of transmitted emission-1 / 150 direct coupling method
TS EN 61967-6 / A1 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method
TS EN 62090 Product package labels for electronic components using barcodes and two-dimensional symbols
TS EN 62132-5 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 5: Faraday cage method for the test table
TS EN 62132-3 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 3: Mass current injection method
TS EN 62132-4 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 4: Direct method of intervening rf power
TS EN 62132-2: 2011 Integrated circuits - Electromagnetic immunity measurements - Part 2: Irradiated immunity measurements- Tem cell and broadband tem cell method
TS EN 62258-5 Semiconductor molding products - Part 5: Rules for information on electrical simulation
TS EN 62258-6 Semiconductor molding products - Part 6: Guidelines for information on thermal simulation
TS EN 62417 Semiconductor devices - Mobile ion experiments for metal oxide semiconductor field effect transistors (mosfet)
TS EN 62433-2 Emu ic modeling - Part 2: Integrated circuit models for emi behavior simulation - Modeling of transmissions through transmission (icce-Ce)
TS EN 165000-1 Film and hybrid integrated circuits - Part 1: General features - capability approval process
TS EN 165000-2 Film and hybrid integrated circuits - part 2: Internal visual inspection and special tests
TS EN 165000-3 Film and hybrid integrated circuits - Part 3: Self-check checklist and report for film and hybrid integrated circuit manufacturers
TS EN 165000-4 Film and hybrid integrated circuits - Part 4: Customer information, product evaluation level plans and blank detail specification
TS EN 165000-5 Film and hybrid integrated circuits - Part 5: Quality approval process
TS EN 190000 General features: Monolithic integrated circuits
TS EN 190100 Part features: Digital monolithic integrated circuits
TS EN 190101 Family features: Digital integrated ttl circuits, 54, 64, 74, 84 series
TS EN 190102 Family features: Ttl schottky digital integrated circuits, 54s, 64s, 74s, 84s series
TS EN 190103 Family features: Digital integrated ttl low power schottky circuits, 54ls, 64ls, 74ls, 84ls series
TS EN 190106 Family features: Ttl advanced low-power schottky digital integrated circuits, 54als and 74als series
TS EN 190107 Family features: Ttl fast digital integrated circuits, 54f and 74f series
TS EN 190108 Family features: Ttl advanced schottky digital integrated circuits, 54as and 74as series
TS EN 190109 Family features: Digital integrated hc mos circuits, hc / hct / hcu series
TS EN 190110 Empty detail specification: Digital microprocessor integrated circuits
TS EN 190116 Family features: Ac mos digital integrated circuits