• +90 212 702 00 00
  • +90 532 281 01 42
  • I info@muayene.co
trarbgzh-TWenfrkadefaru

Integrated Circuits, Microelectronic Standards

As one of the largest and most experienced organizations in certification with more full-time audit experts than any other certification body in the world, we provide certification services in all standards listed below.

 

TS EN 165000-1 Film and hybrid integrated circuits - Part 1: General features: Qualification approval process

TS EN 165000-2 Film and hybrid integrated circuits-Part 2: Internal visual inspection and special tests

TS EN 165000-3 Film and hybrid integrated circuits-Part 3: Final account checklist and report for film and integrated circuit manufacturers

TS EN 165000-4 Film and hybrid integrated circuits - Part 4: Customer information, product evaluation level plans and empty detail specifications

TS EN 165000-5 Film and hybrid integrated circuits - Part 5: Qualification approval method

TS EN 61943 Integration circuits - Manufacturing application guide

TS EN 60747-16-3 Semiconductor devices-Section 16-3: Integrated microwave circuits-Frequency converters

TS EN 61523-1 Delay and power calculation standards - Part 1: Integrated circuit delay and power calculation systems

TS EN 61967-1 Integrated circuits-150 kHz to 1 ghz -Measurement of electromagnetic propagation-Section 1. general terms and recipes

TS EN 61967-4 Integrated circuits-150 kHz to 1 gHz measurement of electromagnetic emission-Part 4: Measurement of transmitted emission-1 / 150 direct coupling method

TS EN 60747-16-10 Semiconductor circuits - Part 16-10: Technology approval scheme for single chip microwave integrated circuits (tas)

TS EN 61967-2 Integrated circuits - 150 KHz - Measurement of 1 GHz electromagnetic emissions - Part 2: Measurement of airborne emissions - TEM cell and broadband TEM cell method

TS EN 60747-16-4 Semiconductor components - Part 16-4: Microwave integrated circuits - Switches

TS EN 60747-16-4 / A1 Semiconductor components - Part 16-4: Microwave integrated circuits - Switches

TS EN 62258-2 Semiconductor membrane products - Part 2: Data interchange formats

TS EN 61967-8 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of irradiated transmissions - IC strip method

TS EN 62132-8 Integrated circuits - Electromagnetic immunity measurements - Part 8: Irradiated immunity measurements-IC stripline method

tst IEC 60191-5 Mechanical standardization of semiconductor elements - Part 5: Recommendations for the application of automatic tabbing to integrated circuit packages  

TS EN 62215-3 Integrated circuits - Measurement of impulse immunity - Part 3: Asynchronous transient injection method

TS EN 62132-1 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General requirements and definitions

TS EN 62433-4 EMC IC modeling - Part 4: Integrated circuit models for RF immune behavior simulation - Conductive immunity modeling (ICIM-CI)

TS EN 60747-16-10 Semiconductor components - Part 16-10: Technology approval scheme for single chip microwave integrated circuits (tas)

TS EN 60747-16-3 / A1 Semiconductor components - Part 16-3: Microwave integrated circuits - Frequency converters

TS EN 61964 Integrated circuits - Memory devices - Pin configuration

TS EN 61967-5 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 5: Measurement of contact transmissions - Bench faraday cage method

TS EN 61967-6 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method

TS EN 61967-4 / A1 Integrated circuits-150 kHz to 1 ghz measurement of electromagnetic emission-Part 4: Measurement of transmitted emission-1 / 150 direct coupling method

TS EN 61967-6 / A1 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method

TS EN 62090 Product package labels for electronic components using barcodes and two-dimensional symbols

TS EN 62132-5 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 5: Faraday cage method for the test table

TS EN 62132-3 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 3: Mass current injection method

TS EN 62132-4 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 4: Direct method of intervening rf power

TS EN 62132-2: 2011 Integrated circuits - Electromagnetic immunity measurements - Part 2: Irradiated immunity measurements- Tem cell and broadband tem cell method

TS EN 62258-5 Semiconductor molding products - Part 5: Rules for information on electrical simulation

TS EN 62258-6 Semiconductor molding products - Part 6: Guidelines for information on thermal simulation

TS EN 62417 Semiconductor devices - Mobile ion experiments for metal oxide semiconductor field effect transistors (mosfet)

TS EN 62433-2 Emu ic modeling - Part 2: Integrated circuit models for emi behavior simulation - Modeling of transmissions through transmission (icce-Ce)

TS EN 165000-1 Film and hybrid integrated circuits - Part 1: General features - capability approval process

TS EN 165000-2 Film and hybrid integrated circuits - part 2: Internal visual inspection and special tests

TS EN 165000-3 Film and hybrid integrated circuits - Part 3: Self-check checklist and report for film and hybrid integrated circuit manufacturers

TS EN 165000-4 Film and hybrid integrated circuits - Part 4: Customer information, product evaluation level plans and blank detail specification

TS EN 165000-5 Film and hybrid integrated circuits - Part 5: Quality approval process

TS EN 190000 General features: Monolithic integrated circuits

TS EN 190100 Part features: Digital monolithic integrated circuits

TS EN 190101 Family features: Digital integrated ttl circuits, 54, 64, 74, 84 series

TS EN 190102 Family features: Ttl schottky digital integrated circuits, 54s, 64s, 74s, 84s series

TS EN 190103 Family features: Digital integrated ttl low power schottky circuits, 54ls, 64ls, 74ls, 84ls series

TS EN 190106 Family features: Ttl advanced low-power schottky digital integrated circuits, 54als and 74als series

TS EN 190107 Family features: Ttl fast digital integrated circuits, 54f and 74f series

TS EN 190108 Family features: Ttl advanced schottky digital integrated circuits, 54as and 74as series

TS EN 190109 Family features: Digital integrated hc mos circuits, hc / hct / hcu series

TS EN 190110 Empty detail specification: Digital microprocessor integrated circuits

TS EN 190116 Family features: Ac mos digital integrated circuits