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TS EN 61797-1 Transformers and coils for telecommunication and electronic devices - Intermediate dimensions of winding formers - Part 1: Winding formers for layered cores
TS EN 60512-19-1 Electromechanical components for electronic devices - Tests and measurements - Part 19-1: Chemical resistance tests - Test 19a: Liquid resistance of pre-insulated crimp tips
TS EN 62047-8 Semiconductor circuits - Micro electromechanical devices - Part 8: Strip bending test method for measuring the elongation property of thin films
TS EN 62047-5 Semiconductor circuits - Micro-electromechanical devices - Part 5: RF MEMS switches
TS EN 62047-10 Semiconductor circuits - Microelectromechanical devices - Part 10: Measurement of elongation property of thin films for Mems materials
TS EN 60512-7-2 Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free connectors) - Test 7b: Mechanical strength impact
TS EN 60512-9-2 Connectors for electronic equipment - Tests and measurements - Part 9-2: Strength tests - Test 9b: Electrical load and temperature
TS EN 60512-9-4 Connectors for electronic equipment - Tests and measurements - Part 9-4: Strength tests - Test 9d: Endurance of connection holding system and gaskets (maintenance, aging)
TS EN 50625-1 Collection, logistics and processing requirements for WEEE - Part 1: General Processing Requirements
TS EN 50625-2-1 Collection, logistics and treatment requirements for WEEE - Part 2-1: Treatment requirements for lamps
TS EN 50625-1 Collection, logistics and treatment requirements for WEEE - Part 1: General treatment requirements
TS EN 50625-2-1 Collection, logistics and treatment requirements for WEEE - Part 2-1: Treatment requirements for lamps
TS EN 60512-1-3 Electromechanical components for electronic devices - Basic test procedures and measuring methods - Part 1: General inspection - Part 3: Test 1c- Electrical coupling length
TS EN 60512-11-1 Electromechanical components of electronic devices - Basic test procedures and measuring methods - Part 11: Climate tests - Part 1: Test 11a - Climate sequence
TS EN 60512-1-4 Electromechanical components for electronic devices - Basic test procedures and measuring methods - Part 1: General - Part 4: Test 1d- Contact protection efficiency (contact resistance)
TS EN 60512-11-8 For electronic devices - Electromechanical components - Basic test procedures and measuring methods - Part 11: Air conditioning tests - Part 8: Test 11h- Sand and dust
TS EN 60512-14-7 For electronic devices - Electromechanical components - Basic test procedures and measuring methods - Part 14: Tightness tests - Part 7: Test 14g: Water hammer
TS EN 60512-11-7 Electromechanical components of electronic devices - Basic test procedures and measuring methods - Part 11: Climate tests - Part 7: Test 11g flowing mixed gas corrosion test
TS EN 60512-6-5 Electromechanical components for electronic devices-Basic test procedures and measurement methods-Part 6: Dynamic stress tests-Part 5: Test 6e: Random vibration
TS EN 60512-19-3 Electromechanical components of electronic devices - Basic test procedures and measuring methods - Part 19: Chemical resistance test - Part 3: Test 19c: Fluid resistance
TS EN 60512-20-2 Electromechanical components for electronic devices-Basic test procedures and measuring methods-Part 20-2: Test 20b- Flammability tests-Fire resistance
tst EN 60512-11-7 Electromechanical components of electronic devices - Basic test procedures and measuring methods - Part 11: Climate tests - Part 7: Test 11g flowing mixed gas corrosion test
60512-20-1: Connectors for electronic devices - Tests and measurements - Part 2010-20: Fire hazard tests-Test 1a: Flammability, needle-flame
TS EN 60512-8-2: 2011 Connectors for electronic devices - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, longitudinal "
TS EN 61797-1 Transformers and inductors for telecommunication and electronic equipment - Main dimensions of coil dies - Part 1: Coil dies for sheet cores
TS EN 62047-4: 2010 Semiconductor circuits - Micro electromechanical devices - Part 4: General specification for Mems
TS EN 62047-6 Semiconductor circuits - Microelectromechanical devices - Part 6: Methods for coaxial fatigue testing of thin film materials