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TS EN 61747-1 Liquid crystal and solid state display devices - Part 1: General feature
TS EN 61747-2-2 Liquid crystal display circuits - Part 2-2: Matrix color LCD modules - Blank detail specification standard
TS EN 61747-4-1 Liquid crystal display circuits - Part 4-1: Matrix color LCD modules - Basic declaration values and specifications
TS EN 61965 Mechanical safety of cathode ray tubes
TS EN 113001 Empty detail specifications, camera tubes
TS EN 61747-5-2 Liquid crystal display devices - Part 5-2: Environmental requirements, durability and mechanical testing methods - Visual inspection of active matrix color liquid crystal display modules
TS EN 61747-6-2 Liquid crystal display devices - Part 6-2: Measuring methods of liquid crystal display modules - Reflective type
TS EN 61988-1 Plasma displays - Part 1: Terminology and letter symbols
TS EN 61747-6-3 Liquid crystal and solid state indicator circuits - Part 6-3: Measurement methods for liquid crystal modules - Measurement of manual movement of active matrix liquid crystal display modules
TS EN 61987-10 / AC Industrial process measurements and control - Data structures and elements in the process hardware catalogs - Part 10: List of specifications for industrial process measurements and control for electronic data exchange (lop) - Basic rules
TS EN 61988-2-4 Plasma screens - Part 2-3: Measurement methods - Image quality: Reflection
TS EN 62595-1-2 LCD backlight unit - Part 1-2: Terminolji and letter symbols
61988-2-1: 2012 Plasma screens - Part 2-1: Measurement methods - Optical
TS EN 61747-4 Liquid crystal display circuits -Chapter 4: Liquid crystal display units and cells-Necessary characteristics and evaluations
TS EN 61747-30-1 Liquid crystal display devices - Part 30-1: Measurement methods for liquid crystal display modules-transmissive type
TS EN 62595-2 LCD Feedback light units - LED feedback Electro optic measurement methods
62629-22-1: Image elements 2013 3D - Part 22-1: Measurement methods for autostereoscopic displays - Optical
TS EN 61747-2-1 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail feature
TS EN 62595-1-1 LCD backlight unit-Section 1-1: General features
TS EN 62341-5-3 Organic light-emitting diode screens - Part 5 - 3: Test methods for life and image retention
TS EN 60286-3 Packaging of components for automatic machining section 3: Packaging of elements placed on the surface on continuously moving strips
62629-1-2 Image elements - Section 3-1 General - Terms and letter symbols
TS EN 61747-10-1 Liquid crystal display devices - Part 10-1: Environmental requirements, durability and mechanical test methods -Mechanical
TS EN 60286-3 / AC Packaging of components for automatic machining part 3: Packaging of elements placed on the surface on continuously moving strips
tst EN 62595-1-2 LCD backlight unit - Part 1-2: Therminolgia and letter symbols
TS EN 50360 / tst A1 Product standard that demonstrates the suitability of mobile telephones with the basic limitations of electromagnetic fields (300 mhz-3 ghz) to which people are exposed
tst EN 50065-4-6 3 khz - Signing in low voltage electrical installations in the frequency range 148,5 khz - Part 4-6: Low voltage decoupling filters - Angle coupler
tst ISO / IEC 8825-2 Information technology - Asn.1 encryption rules: Feature (pack) related to packaged encryption rules
tst EN 50065-4-4 3 khz - Signing in low-voltage electrical installations in the frequency range 148,5 khz - Part 4-4: Low voltage decoupling filter - Impedance filter
tst EN 12016 Electromagnetic compatibility - Product family standard for elevators, escalators and conveyors - Immunity
TS EN 50625-2-2 Collection, handling and treatment requirements for Waste Electrical and Electronic Equipment - Part 2-2: Treatment requirements for Waste Electrical and Electronic Equipment including CRTs and flat panel displays
tst EN 50625-2-2 Collection, handling and treatment requirements for Waste Electrical and Electronic Equipment - Part 2-2: Treatment requirements for Waste Electrical and Electronic Equipment including CRTs and flat panel displays
TS EN 62341-5-3 Organic light-emitting diode screens - Part 5 - 3: Test methods for life and image retention
TS EN 50528 Insulating gloves for use on or near low voltage installations
TS EN 61747-5-3 Liquid crystal display devices - Part 5-3: Environmental requirements, durability and mechanical testing methods - Glass strength and reliability
TS EN 61747-1 / A1 Liquid crystal and solid state display devices - Part 1: General feature
TS EN 61747-3 Liquid crystal display elements - Part 3: Liquid crystal display (lcd) cells - Part features
TS EN 61967-5 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 5: Measurement of contact transmissions - Bench faraday cage method
TS EN 61967-6 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method
TS EN 61967-4 / A1 Integrated circuits-150 kHz to 1 ghz measurement of electromagnetic emission-Part 4: Measurement of transmitted emission-1 / 150 direct coupling method
TS EN 61967-6 / A1 Integrated circuits - 150 khz - Measurement of 1 ghz electromagnetic emissions - Part 6: Measurement of contact transmissions - Magnetic probe method
TS EN 62090 Product package labels for electronic components using barcodes and two-dimensional symbols
TS EN 62132-5 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 5: Faraday cage method for the test table
TS EN 62132-3 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 3: Mass current injection method
TS EN 62132-4 Integrated circuits - Electromagnetic immunity measurements for the frequency range 150 khz to 1 gHz - Part 4: Direct method of intervening rf power
TS EN 62132-2: 2011 Integrated circuits - Electromagnetic immunity measurements - Part 2: Irradiated immunity measurements- Tem cell and broadband tem cell method
TS EN 62258-5 Semiconductor molding products - Part 5: Rules for information on electrical simulation
TS EN 62258-6 Semiconductor molding products - Part 6: Guidelines for information on thermal simulation
TS EN 62417 Semiconductor devices - Mobile ion experiments for metal oxide semiconductor field effect transistors (mosfet)
TS EN 62433-2 Emu ic modeling - Part 2: Integrated circuit models for emi behavior simulation - Modeling of transmissions through transmission (icce-Ce)
TS EN 165000-1 Film and hybrid integrated circuits - Part 1: General features - capability approval process
TS EN 165000-2 Film and hybrid integrated circuits - part 2: Internal visual inspection and special tests
TS EN 165000-3 Film and hybrid integrated circuits - Part 3: Self-check checklist and report for film and hybrid integrated circuit manufacturers
TS EN 165000-4 Film and hybrid integrated circuits - Part 4: Customer information, product evaluation level plans and blank detail specification
TS EN 165000-5 Film and hybrid integrated circuits - Part 5: Quality approval process
TS EN 190000 General features: Monolithic integrated circuits
TS EN 190100 Part features: Digital monolithic integrated circuits
TS EN 190101 Family features: Digital integrated ttl circuits, 54, 64, 74, 84 series
TS EN 190102 Family features: Ttl schottky digital integrated circuits, 54s, 64s, 74s, 84s series
TS EN 190103 Family features: Digital integrated ttl low power schottky circuits, 54ls, 64ls, 74ls, 84ls series
TS EN 190106 Family features: Ttl advanced low-power schottky digital integrated circuits, 54als and 74als series
TS EN 190107 Family features: Ttl fast digital integrated circuits, 54f and 74f series
TS EN 190108 Family features: Ttl advanced schottky digital integrated circuits, 54as and 74as series
TS EN 190109 Family features: Digital integrated hc mos circuits, hc / hct / hcu series
TS EN 190110 Empty detail specification: Digital microprocessor integrated circuits
TS EN 190116 Family features: Ac mos digital integrated circuits